In situ real-time characterization of thin films / edited by Orlando Auciello, Alan R. Krauss, Argonne National Laboratory, Argonne, Illinois.
Material type:
TextPublisher: New York : John Wiley & Sons, Inc., [2001]Copyright date: c2001Description: xi, 263 pages : illustrations ; 25 cmContent type: - text
- unmediated
- volume
- 0471241415 (cloth : alk. paper)
- 9780471241416
- 530.4275 INS 22
| Cover image | Item type | Current library | Home library | Collection | Shelving location | Call number | Materials specified | Vol info | URL | Copy number | Status | Notes | Date due | Barcode | Item holds | Item hold queue priority | Course reserves | |
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Book - Borrowing
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Central Library First floor | Alahram | 530.4275INS (Browse shelf(Opens below)) | Available | 000011158 |
Total holds: 0
"A Wiley-Interscience publication."
Includes bibliographical references and index.
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