In situ real-time characterization of thin films / edited by Orlando Auciello, Alan R. Krauss, Argonne National Laboratory, Argonne, Illinois.
In situ real-time characterization of thin films / edited by Orlando Auciello, Alan R. Krauss, Argonne National Laboratory, Argonne, Illinois.
- xi, 263 pages : illustrations ; 25 cm
"A Wiley-Interscience publication."
Includes bibliographical references and index.
0471241415 (cloth : alk. paper) 9780471241416
Thin films.
--Reading book
530.4275 / INS
"A Wiley-Interscience publication."
Includes bibliographical references and index.
0471241415 (cloth : alk. paper) 9780471241416
Thin films.
--Reading book
530.4275 / INS