In situ real-time characterization of thin films / edited by Orlando Auciello, Alan R. Krauss, Argonne National Laboratory, Argonne, Illinois.

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TextPublisher: New York : John Wiley & Sons, Inc., [2001]Copyright date: c2001Description: xi, 263 pages : illustrations ; 25 cmContent type:

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Cover image	Item type	Current library	Home library	Collection	Shelving location	Call number	Materials specified	Vol info	URL	Copy number	Status	Notes	Date due	Barcode	Item holds	Item hold queue priority	Course reserves
	Book - Borrowing	Central Library First floor		Alahram		530.4275INS (Browse shelf(Opens below))					Available			000011158

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"A Wiley-Interscience publication."

Includes bibliographical references and index.

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