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Fundamentals of nanoscale film analysis / Terry L. Alford, Leonard C. Feldman and James W. Mayer.

By: Contributor(s): Material type: TextPublication details: New York, N.Y. ; London : Springer,c2007. c2007.Description: xiv, 336 p. : ill. ; 25 cmISBN:
  • 9780387292601 (hbk.)
  • 0387292608 (hbk.)
  • 0387292616 (e-book)
  • 9780387292618 (e-book)
Subject(s): DDC classification:
  • 621.38152 ALF
Online resources: Catalogued By: Mahitab.
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Holdings
Cover image Item type Current library Home library Collection Shelving location Call number Materials specified Vol info URL Copy number Status Notes Date due Barcode Item holds Item hold queue priority Course reserves
Book - Borrowing Central Library First floor 621.38152ALF (Browse shelf(Opens below)) Available 000009722
Total holds: 0

Distributer: Al-Ahram.

Includes bibliographical references and index.

Catalogued By: Mahitab.

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