Fundamentals of nanoscale film analysis /
Alford, Terry L.
Fundamentals of nanoscale film analysis / Terry L. Alford, Leonard C. Feldman and James W. Mayer. - New York, N.Y. ; London : Springer,c2007. c2007. - xiv, 336 p. : ill. ; 25 cm.
Distributer: Al-Ahram.
Includes bibliographical references and index.
Catalogued By: Mahitab.
9780387292601 (hbk.) 0387292608 (hbk.) 0387292616 (e-book) 9780387292618 (e-book)
2005933265
Thin films.
Nanostructured materials.
621.38152 / ALF
Fundamentals of nanoscale film analysis / Terry L. Alford, Leonard C. Feldman and James W. Mayer. - New York, N.Y. ; London : Springer,c2007. c2007. - xiv, 336 p. : ill. ; 25 cm.
Distributer: Al-Ahram.
Includes bibliographical references and index.
Catalogued By: Mahitab.
9780387292601 (hbk.) 0387292608 (hbk.) 0387292616 (e-book) 9780387292618 (e-book)
2005933265
Thin films.
Nanostructured materials.
621.38152 / ALF