| 000 | 01043nac a22002891u 4500 | ||
|---|---|---|---|
| 010 | _a 2005933265 | ||
| 020 | _a9780387292601 (hbk.) | ||
| 020 | _a0387292608 (hbk.) | ||
| 020 | _a0387292616 (e-book) | ||
| 020 | _a9780387292618 (e-book) | ||
| 035 | _a(OCoLC)ocn124465046 | ||
| 082 | 0 | 0 |
_a621.38152 _bALF |
| 090 |
_c7967 _d7967 |
||
| 100 | _aAlford, Terry L. | ||
| 245 | 1 | 0 |
_aFundamentals of nanoscale film analysis / _cTerry L. Alford, Leonard C. Feldman and James W. Mayer. |
| 260 |
_aNew York, N.Y. ; _aLondon : _bSpringer,c2007. _cc2007. |
||
| 300 |
_axiv, 336 p. : _bill. ; _c25 cm. |
||
| 500 | _aDistributer: Al-Ahram. | ||
| 504 | _aIncludes bibliographical references and index. | ||
| 511 | _aCatalogued By: Mahitab. | ||
| 650 | 0 | _aThin films. | |
| 650 | 0 | _aNanostructured materials. | |
| 700 | 1 | _aFeldman, Leonard C. | |
| 700 | 1 |
_aMayer, James W., _d1930- |
|
| 856 | 4 | 1 |
_3Table of contents only _uhttp://www.loc.gov/catdir/toc/fy0713/2005933265.html |
| 942 |
_cBB _k621.38152ALF |
||
| 999 |
_c7967 _d7967 |
||