| 000 | 00920nac a22002171u 4500 | ||
|---|---|---|---|
| 010 | _a2002027055 | ||
| 020 | _a0130084654 | ||
| 082 | 0 | 0 |
_a621.39/73 _bC4356 |
| 090 |
_c729 _d729 |
||
| 100 | _aChakraborty, Kanad. | ||
| 245 | 1 | 0 |
_aFault-tolerance and reliability techniques for high-density random-access memories / _cKanad Chakraborty, Pinaki Mazumder. |
| 260 |
_aNew Delhi : _bPrentice Hall of India, _cc2002. |
||
| 300 |
_axix, 426 p. : _bill. ; _c25 cm. |
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| 504 | _aIncludes bibliographical references (p. 377-417) and index. | ||
| 650 | 0 |
_aRandom access memory _xReliability. |
|
| 650 | 0 |
_aIntegrated circuits _xFault tolerance. |
|
| 650 | 0 | _aSemiconeductor storage devices. | |
| 700 | 1 | _aMazumder, Pinaki. | |
| 942 |
_cBB _k621.39/73C4356 |
||
| 999 |
_c729 _d729 |
||