| 000 | 01538cam a22003254a 4500 | ||
|---|---|---|---|
| 001 | 12302030 | ||
| 005 | 20040621182341.0 | ||
| 008 | 010206s2001 nyua b 001 0 eng | ||
| 010 | _a2001017842 | ||
| 020 | _a0471239291 (alk. paper) | ||
| 040 |
_aDLC _cDLC _dDLC |
||
| 042 | _apcc | ||
| 050 | 0 | 0 |
_aQ327 _b.K57 2001 |
| 082 | 0 | 0 |
_a006.42 _221 _bKIR |
| 100 | 1 |
_aKirby, Michael, _d1961- _96296 |
|
| 245 | 1 | 0 |
_aGeometric Data Analysis : _bAn Empirical Approach to Dimensionality Reduction and the Study of Patterns / _cMichael Kirby. |
| 260 |
_aNew York : _bWiley, _cc2001. |
||
| 300 |
_axvii, 363 p. : _bill. ; _c25 cm. |
||
| 500 | _a"A Wiley-Interscience publication." | ||
| 504 | _aIncludes bibliographical references (p. 349-358) and index. | ||
| 650 | 0 |
_aPattern perception. _96297 |
|
| 650 | 0 |
_aPattern recognition systems. _96298 |
|
| 650 | 0 |
_aArtificial intelligence. _96299 |
|
| 856 | 4 | 2 |
_3Contributor biographical information _uhttp://www.loc.gov/catdir/bios/wiley042/2001017842.html |
| 856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/description/wiley034/2001017842.html |
| 856 | 4 |
_3Table of Contents _uhttp://www.loc.gov/catdir/toc/onix05/2001017842.html |
|
| 942 |
_2ddc _cBB |
||
| 999 |
_c11864 _d11864 |
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