000			01049nam a22002775a 4500
001			15187446
005			20080220180003.0
008			080220s2008 nyu 000 0 eng
010			_a 2008923469
020			_a9780387787008 (hardcover : alk. paper)
040			_aDLC _cDLC
082			_222 _a621.381 _bMIC
245	0	0	_aMicro and nano mechanical testing of materials and devices / _c[edited by] Fuqian Yang, James C.M. Li.
260			_aNew York : _bSpringer, _c2008.
263			_a0806
300			_axiii, 387 p. : _bill. ; _c 24 cm.
500			_aIncludes index
650			_93987 _a Materials _x-- Testing.
650			_93988 _aMicroelectromechanical systems _x-- Testing.
650			_93989 _aNanoelectromechanical systems _x-- Testing.
700			_93990 _aYang, Fuqian
700			_93991 _aLi, James C. M.
942			_2ddc _cBB
999			_c11367 _d11367