000 00901nam a22002655a 4500
001 15317179
005 20080605081522.0
008 080605s2008 nyu 000 0 eng
010 _a 2008930489
020 _a9781848002968 (hardcover : alk. paper)
040 _aDLC
_cDLC
082 _222
_a620.44
_bMUR
100 1 _aMuralikrishnan, Bala.
_93596
245 1 0 _aComputational surface and roundness metrology /
_cBala Muralikrishnan, Jay Raja.
250 _a1st ed.
260 _aNew York :
_bSpringer,
_c2008.
263 _a0808
300 _a263p:
_bill;
_c22cm.
500 _aIncludes Index.
650 _93594
_aSurfaces technology-Measurement.
650 _93595
_aRoundness measurement
942 _2ddc
_cBB
999 _c11281
_d11281