01478nac a22003371i 4500003000900000005001700009008004100026020003600067020001800103040004300121082002200164245014800186264004900334264001000383300004400393336002600437337002800463338002700491500004000518504005100558650002300609655001700632700004000649700003400689856009600723856008800819856007400907942001200981999001500993952013201008EG-ScBUE20250427102518.0250413s2001    nyua   f b    001 0 eng d  a0471241415 (cloth : alk. paper)  a9780471241416  aEG-ScBUEbengerdacEG-ScBUEdEG-ScBUE04a530.4275bINS22200aIn situ real-time characterization of thin films /bedited by Orlando Auciello, Alan R. Krauss, Argonne National Laboratory, Argonne, Illinois. 1aNew York :bJohn Wiley & Sons, Inc.,c[2001] 4cc2001  axi, 263 pages :billustrations ;c25 cm  2rdacontentatextbtxt  aunmediated2rdamediabn  avolumebnc2rdacarrier  a"A Wiley-Interscience publication."  aIncludes bibliographical references and index. 7aThin films.2BUEsh  vReading book1 aAuciello, Orlando,d1945-,4editor.1 aKrauss, Alan Robert,eeditor.423Contributor biographical informationuhttp://www.loc.gov/catdir/bios/wiley043/00025162.html423Publisher descriptionuhttp://www.loc.gov/catdir/description/wiley035/00025162.html423Table of Contentsuhttp://www.loc.gov/catdir/toc/onix06/00025162.html  cBB2ddc  c9090d9090  00102ddc40708AlahramaMAINbMAINc1STd2014-04-08ePurchasel0o530.4275INSp000011158r2025-07-15 00:00:00w2008-04-14yBB