TY  - GEN
AU  - Auciello,Orlando
AU  - Krauss,Alan Robert
TI  - In situ real-time characterization of thin films: edited by Orlando Auciello, Alan R. Krauss, Argonne National Laboratory, Argonne, Illinois
SN  - 0471241415 (cloth : alk. paper)
U1  - 530.4275 22
PY  - 2001///]
CY  - New York
PB  - John Wiley & Sons, Inc.
KW  - Thin films
KW  - BUEsh
KW  - Reading book
N1  - "A Wiley-Interscience publication."; Includes bibliographical references and index
UR  - http://www.loc.gov/catdir/bios/wiley043/00025162.html
UR  - http://www.loc.gov/catdir/description/wiley035/00025162.html
UR  - http://www.loc.gov/catdir/toc/onix06/00025162.html
ER  -