TY  - GEN
AU  - Alford, Terry L.             
AU  - Feldman,Leonard C.
AU  - Mayer,James W.
TI  - Fundamentals of nanoscale film analysis
SN  - 9780387292601 (hbk.)
U1  - 621.38152 
PY  - 2007///
CY  - New York, N.Y., London
PB  - Springer,c2007.
KW  - Thin films
KW  - Nanostructured materials
N1  - Distributer: Al-Ahram; Includes bibliographical references and index; Catalogued By: Mahitab
UR  - http://www.loc.gov/catdir/toc/fy0713/2005933265.html
ER  -