01043nac a22002891u 4500 2005933265 9780387292601 (hbk.) 0387292608 (hbk.) 0387292616 (e-book) 9780387292618 (e-book) (OCoLC)ocn124465046 621.38152 ALF 7967 7967 Alford, Terry L. Fundamentals of nanoscale film analysis / Terry L. Alford, Leonard C. Feldman and James W. Mayer. New York, N.Y. ; London : Springer,c2007. c2007. xiv, 336 p. : ill. ; 25 cm. Distributer: Al-Ahram. Includes bibliographical references and index. Catalogued By: Mahitab. Thin films. Nanostructured materials. Feldman, Leonard C. Mayer, James W., 1930- Table of contents only http://www.loc.gov/catdir/toc/fy0713/2005933265.html BB 621.38152ALF 7967 7967 0 0 0 0 MAIN MAIN 1ST 2014-02-08 Purchase 0 621.38152ALF 000009722 2025-07-15 00:00:00 BB