TY  - GEN
AU  - Chakraborty, Kanad.          
AU  - Mazumder,Pinaki
TI  - Fault-tolerance and reliability techniques for high-density random-access memories
SN  - 0130084654
U1  - 621.39/73 
PY  - 2002///
CY  - New Delhi
PB  - Prentice Hall of India
KW  - Random access memory
KW  - Reliability
KW  - Integrated circuits
KW  - Fault tolerance
KW  - Semiconeductor storage devices
N1  - Includes bibliographical references (p. 377-417) and index
ER  -