TY  - GEN
AU  - 20080729                     
AU  - Fahrner,W.R.
TI  - Nanotechnology and nanoelectronics: materials, devices, measurement techniques 
SN  - 3540224521
U1  - 620.5 
PY  - 2005///
CY  - Berlin, New York
PB  - Springer-Verlag,2005.
KW  - Nanotechnology
N1  - Includes bibliographical references (p. [239]-260) and index
UR  - http://www.loc.gov/catdir/toc/fy054/2004109048.html
ER  -