00984nam a22002655a 45000010009000000050017000090080041000260100017000670200043000840400013001270820021001402450106001612600033002672630009003003000036003095000019003456500034003646500055003986500054004537000023005077000026005309420012005569990017005689520133005851518744620080220180003.0080220s2008    nyu           000 0 eng    a  2008923469  a9780387787008 (hardcover : alk. paper)  aDLCcDLC  222a621.381bMIC00aMicro and nano mechanical testing of materials and devices /c[edited by] Fuqian Yang, James C.M. Li.  aNew York :bSpringer,c2008.  a0806  axiii, 387 p. :bill. ;c 24 cm.  aIncludes index  93987a Materialsx-- Testing.  93988aMicroelectromechanical systemsx--  Testing.  93989aNanoelectromechanical systems x-- Testing.  93990aYang, Fuqian  93991aLi, James C. M.  2ddccBB  c11367d11367  00102ddc40708AlahramaMAINbMAINc1STd2009-04-21epurchaseg696.00h362l0o621.381 MICp000016046r2025-07-15 00:00:00yBB