Thin film materials : stress, defect formation, and surface evolution / L.B. Freund, S. Suresh.
Material type:
TextPublication details: Cambridge, [England] ; New York : Cambridge University Press, c.2003.Description: xviii, 750 p. : ill. ; 25 cmISBN: - 0521822815
- 9780521529778
- 621.38152 21 FRE
- TA418.9.T45 F74 2003
| Cover image | Item type | Current library | Home library | Collection | Shelving location | Call number | Materials specified | Vol info | URL | Copy number | Status | Notes | Date due | Barcode | Item holds | Item hold queue priority | Course reserves | |
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Book - Borrowing
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Central Library First floor | Alahram | 621.38152 FRE (Browse shelf(Opens below)) | 35 | Available | 000019599 |
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| 621.38152 DIM Principles of semiconductor devices / | 621.38152 DIM Understanding Semiconductor Devices / | 621.38152 FOC Focused ion beam systems : | 621.38152 FRE Thin film materials : | 621.38152 HAN Handbook of thin film deposition : | 621.38152 LOW Semiconductor x-ray detectors / | 621.38152 NEA An introduction to Semiconductor devices / |
Includes Index.
Includes bibliographical references (p. 713-737) and indexes.
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