Fault-tolerance and reliability techniques for high-density random-access memories /
Chakraborty, Kanad.
Fault-tolerance and reliability techniques for high-density random-access memories / Kanad Chakraborty, Pinaki Mazumder. - New Delhi : Prentice Hall of India, c2002. - xix, 426 p. : ill. ; 25 cm.
Includes bibliographical references (p. 377-417) and index.
0130084654
2002027055
Random access memory--Reliability.
Integrated circuits--Fault tolerance.
Semiconeductor storage devices.
621.39/73 / C4356
Fault-tolerance and reliability techniques for high-density random-access memories / Kanad Chakraborty, Pinaki Mazumder. - New Delhi : Prentice Hall of India, c2002. - xix, 426 p. : ill. ; 25 cm.
Includes bibliographical references (p. 377-417) and index.
0130084654
2002027055
Random access memory--Reliability.
Integrated circuits--Fault tolerance.
Semiconeductor storage devices.
621.39/73 / C4356